Coverage-directed Assignment Approach to Bist
نویسندگان
چکیده
We present a novel test-per-clock BIST method for combinational or full-scan circuits. Our task is to design a combinational circuit, namely the output decoder, transforming the pseudorandom LFSR code words into the required test patterns pre-generated by some ATPG tool. The process is based on finding the coverage of the ones in the test vectors and the subsequent generation of implicants that correspond to this coverage. The implicants are derived from the LFSR code words. The design of the output decoder is taken as a general combinatorial problem and it can be exploited in other areas of logic design too.
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